Mixed-Signal DFT for fully testable ASIC

An efficient mixed-signal design strategy for test insertion standardization. The mixed-signal DFT (Design For Test) strategy is built on three main linchpins: DFT and other design rules, DFT design structures and finally design to test interactions. Such a design strategy improves the overall device fault coverage which leads to minimal device failure rate on the customer side. This poster article explains first the design strategy in detail and finally highlights the reached results.