DocumentCode
3628020
Title
Measurement and Simulation of Self-Heating in DMOS Transistors up to Very High Temperatures
Author
; ;
fYear
2008
Firstpage
209
Lastpage
212
Keywords
"Temperature sensors","Sensor arrays","Electrothermal effects","Semiconductor device measurement","Temperature measurement","Power measurement","Transistors","Semiconductor optical amplifiers","Numerical simulation","Spatial resolution"
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and IC´s, 2008. ISPSD ´08. 20th International Symposium on
ISSN
1063-6854
Print_ISBN
978-1-4244-1532-8
Electronic_ISBN
1946-0201
Type
conf
DOI
10.1109/ISPSD.2008.4538935
Filename
4538935
Link To Document