DocumentCode :
3629373
Title :
CMOS temperature sensor using periodic averaging for error reduction
Author :
M. Yucetas;L. Aaltonen;K. Halonen
Author_Institution :
Department of Micro and Nanosciences, HUT, Otakaari 5 A, 02150 Espoo, Finland
fYear :
2008
Firstpage :
131
Lastpage :
134
Abstract :
A fully integrated temperature sensor is implemented in a 0.35 μm CMOS technology. Sensor can measure the temperature with maximum inaccuracy of ±0.56 °C (3σ) over temperature range of −40 °C to +85 °C. Parasitic substrate pnp transistors are used for temperature sensing. Dynamic element matching (DEM) technique is used to reduce the effect of matching errors of components. An on-chip clock source, control logic, low-pass filter and an output buffer ared added to the PTAT sensor core. Further spread of components is decreased by using one point gain calibration at package level. The total power consumption of the sensor is 374 μW and the active chip area is 0.64 mm2.
Keywords :
"Integrated circuits","Conferences"
Publisher :
ieee
Conference_Titel :
Electronics Conference, 2008. BEC 2008. 11th International Biennial Baltic
ISSN :
1736-3705
Print_ISBN :
978-1-4244-2059-9
Electronic_ISBN :
2382-820X
Type :
conf
DOI :
10.1109/BEC.2008.4657496
Filename :
4657496
Link To Document :
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