Title :
Semiconductor materials for optoelectronic THz systems activated by long-wavelength lasers
Author :
A. Krotkus;R. Adomavicius;V. Pacebutas
Author_Institution :
Semiconductor Physics Institute (SPI), 01108, A. Gostauto 11, Vilnius, Lithuania
Abstract :
Semiconductor materials that can be used for manufacturing THz emitters and THz detectors for pulsed optoelectronic terahertz time-domain spectroscopy systems activated by femtosecond lasers of the infrared wavelength range are reviewed. THz emission from unbiased surfaces of various semiconductors has been investigated and analyzed; it was shown that the best emitter is p-type InAs crystal. Optoelectronic THz detectors were manufactured from several semiconducting materials that are meeting the requirements for such devices such as sub-picosecond electron lifetime, high electron mobility, and large dark resistivity. The best results were achieved when using low-temperature-grown GaBiAs epitaxial layers. Characteristics of THz optoelectronic system employing GaBiAs detector (the frequency bandwidth of 5 THz and the dynamical range of 60 dB) were comparable to those systems based on the Ti:sapphire lasers and GaAs photoconducting antennae.
Keywords :
"Semiconductor materials","Semiconductor lasers","Surface emitting lasers","Semiconductor device manufacture","Infrared detectors","Electron mobility","Optical pulses","Time domain analysis","Spectroscopy","Infrared spectra"
Conference_Titel :
THz Radiation: Basic Research and Applications, 2008. TERA 2008. International Workshop
Print_ISBN :
978-1-4244-2686-7
DOI :
10.1109/TERA.2008.4673822