DocumentCode
3629687
Title
Application of FPGA units in combined temperature cycle and vibration reliability tests of lead-free interconnections
Author
Przemyslaw Matkowski;Krzysztof Urbanski Tomasz Falat;Jan Felba;Zbigniew Zaluk;Rafal Zwierta;Abhijit Dasgupta;Michael Pecht
Author_Institution
Wroclaw University of Technology, Poland
fYear
2008
Firstpage
1375
Lastpage
1380
Abstract
According to the European Directive 2002/95/EC RoHS solders that contain lead have to be replaced with lead-free equivalents. Replacing well-known materials with new materials not only force technological adaptations but also force necessity of reliability investigations, especially new failure modes.
Keywords
"Field programmable gate arrays","Temperature","Testing","Environmentally friendly manufacturing techniques","Lead","Soldering","Electrical resistance measurement","Stress","Vibration measurement","Materials reliability"
Publisher
ieee
Conference_Titel
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Print_ISBN
978-1-4244-2813-7
Type
conf
DOI
10.1109/ESTC.2008.4684556
Filename
4684556
Link To Document