• DocumentCode
    3630974
  • Title

    (S)TEM tomography of AlAs-GaAs coaxial Nanowires

  • Author

    Josep M. Rebled;Sonia Conesa-Boj;Jordi Arbiol;Francesca Peiro;Joan R. Morante;Matthias Heigoldt;Dance Spirkoska;Gerhard Abstreiter;Anna Fontcuberta i Morral

  • Author_Institution
    MIND-IN2UB, Dept. Electr?nica, Universitat de Barcelona, Mart? i Franqu?s 1, 08028 Barcelona, CAT, Spain, phone:(+34) 934021695
  • fYear
    2009
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    (S) TEM tomography is used as a complementary tool to characterize AlAs-GaAs coaxial nanowires. These nanostructures have been grown on two different GaAs substrate orientations using molecular-beam epitaxy (MBE). The results show that quantum wells synthesized on nanowires grown on different substrate orientations present different morphology, which induces changes on their photoluminescence properties.
  • Keywords
    "Tomography","Coaxial components","Nanowires","Molecular beam epitaxial growth","Image reconstruction","Substrates","Electrons","Nanostructures","Gallium arsenide","Quantum computing"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2009. CDE 2009. Spanish Conference on
  • ISSN
    2163-4971
  • Print_ISBN
    978-1-4244-2838-0
  • Type

    conf

  • DOI
    10.1109/SCED.2009.4800431
  • Filename
    4800431
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3630974