Title :
(S)TEM tomography of AlAs-GaAs coaxial Nanowires
Author :
Josep M. Rebled;Sonia Conesa-Boj;Jordi Arbiol;Francesca Peiro;Joan R. Morante;Matthias Heigoldt;Dance Spirkoska;Gerhard Abstreiter;Anna Fontcuberta i Morral
Author_Institution :
MIND-IN2UB, Dept. Electr?nica, Universitat de Barcelona, Mart? i Franqu?s 1, 08028 Barcelona, CAT, Spain, phone:(+34) 934021695
Abstract :
(S) TEM tomography is used as a complementary tool to characterize AlAs-GaAs coaxial nanowires. These nanostructures have been grown on two different GaAs substrate orientations using molecular-beam epitaxy (MBE). The results show that quantum wells synthesized on nanowires grown on different substrate orientations present different morphology, which induces changes on their photoluminescence properties.
Keywords :
"Tomography","Coaxial components","Nanowires","Molecular beam epitaxial growth","Image reconstruction","Substrates","Electrons","Nanostructures","Gallium arsenide","Quantum computing"
Conference_Titel :
Electron Devices, 2009. CDE 2009. Spanish Conference on
Print_ISBN :
978-1-4244-2838-0
DOI :
10.1109/SCED.2009.4800431
