• DocumentCode
    3631269
  • Title

    Numerical approach to extraction of elasto-plastic material models and corresponding properties of thin layers through nanoindentation technique

  • Author

    Artur Wymyslowski;O. Wittler;R. Mrossko;Rainer Dudek;Juergen Auersperg;Lukasz Dowhan

  • Author_Institution
    Wroc?aw University of Technology, Faculty of Microsystem Electronics and Photonics, ul. Janiszewskiego 11/17, 50-372, Poland
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Current developments and trends in microelectronics are focused on thin layers and novel materials. This leads to application of different test and measurement methods, which are capable to measure basic mechanical properties of such materials on micro-scale and nano-scale. The presented project focuses on application of the nanoindentation technique in order to extract the basic elastic and elasto-plastic mechanical properties of aluminium through analytical and numerical approaches. The results allowed to select the most appropriate elastoplastic material model that would be capable of fitting the experimental and numerical results. According to the performed analysis it was concluded that Ramberg-Osgood model fulfil the above criteria and can be used to predict the nanoindentation results in case of very thin aluminium layers.
  • Keywords
    "Shape measurement","Material properties","Algorithm design and analysis","Data mining","Packaging","Materials testing","Electrical resistance measurement","Analytical models","Optimization methods","Numerical analysis"
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
  • Print_ISBN
    978-1-4244-4159-4;978-1-4244-4160-0
  • Type

    conf

  • DOI
    10.1109/ESIME.2009.4938422
  • Filename
    4938422