Title :
Behaviour of plastic encapsulated devices in marine environment
Author :
M. Dragan;M. Bazu
Author_Institution :
Res. Inst. for Electron. Components, Bucharest, Romania
Abstract :
The behaviour of two types of plastic encapsulated devices (complementary NPN and PNP transistors) in salt mist and cycling salt mist tests was studied. The results show that cycling salt mist test accelerates the salt mist test and the acceleration factors were calculated for the degradation mechanisms involved.
Keywords :
"Plastics","Testing","Bipolar transistors","Performance evaluation"
Conference_Titel :
Semiconductor Conference, 1995. CAS´95 Proceedings., 1995 International
Print_ISBN :
0-7803-2647-4
DOI :
10.1109/SMICND.1995.494899
