DocumentCode
3631299
Title
Behaviour of plastic encapsulated devices in marine environment
Author
M. Dragan;M. Bazu
Author_Institution
Res. Inst. for Electron. Components, Bucharest, Romania
fYear
1995
Firstpage
207
Lastpage
210
Abstract
The behaviour of two types of plastic encapsulated devices (complementary NPN and PNP transistors) in salt mist and cycling salt mist tests was studied. The results show that cycling salt mist test accelerates the salt mist test and the acceleration factors were calculated for the degradation mechanisms involved.
Keywords
"Plastics","Testing","Bipolar transistors","Performance evaluation"
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1995. CAS´95 Proceedings., 1995 International
Print_ISBN
0-7803-2647-4
Type
conf
DOI
10.1109/SMICND.1995.494899
Filename
494899
Link To Document