DocumentCode
3631512
Title
A new architecture of filter designed for testability
Author
M.D. Lutovac;D.M. Rabrenovic
Author_Institution
IRITEL Telecommun. & Electron. Inst., Belgrade, Yugoslavia
Volume
2
fYear
1995
Firstpage
753
Abstract
A new architecture of integrated or multi-chip module circuit suitable for volume production of analog filters is considered. Two groups of simple identical subcircuits and a built-in self-test structure enable testing, detecting and correcting the malfunctioning during production and actual operation.
Keywords
"Filters","Circuit testing","Attenuation","Passband","Digital integrated circuits","Frequency","Production","Automatic testing","Delay","Integrated circuit testing"
Publisher
ieee
Conference_Titel
Microelectronics, 1995. Proceedings., 1995 20th International Conference on
Print_ISBN
0-7803-2786-1
Type
conf
DOI
10.1109/ICMEL.1995.500962
Filename
500962
Link To Document