Title :
A new architecture of filter designed for testability
Author :
M.D. Lutovac;D.M. Rabrenovic
Author_Institution :
IRITEL Telecommun. & Electron. Inst., Belgrade, Yugoslavia
Abstract :
A new architecture of integrated or multi-chip module circuit suitable for volume production of analog filters is considered. Two groups of simple identical subcircuits and a built-in self-test structure enable testing, detecting and correcting the malfunctioning during production and actual operation.
Keywords :
"Filters","Circuit testing","Attenuation","Passband","Digital integrated circuits","Frequency","Production","Automatic testing","Delay","Integrated circuit testing"
Conference_Titel :
Microelectronics, 1995. Proceedings., 1995 20th International Conference on
Print_ISBN :
0-7803-2786-1
DOI :
10.1109/ICMEL.1995.500962
