• DocumentCode
    3631512
  • Title

    A new architecture of filter designed for testability

  • Author

    M.D. Lutovac;D.M. Rabrenovic

  • Author_Institution
    IRITEL Telecommun. & Electron. Inst., Belgrade, Yugoslavia
  • Volume
    2
  • fYear
    1995
  • Firstpage
    753
  • Abstract
    A new architecture of integrated or multi-chip module circuit suitable for volume production of analog filters is considered. Two groups of simple identical subcircuits and a built-in self-test structure enable testing, detecting and correcting the malfunctioning during production and actual operation.
  • Keywords
    "Filters","Circuit testing","Attenuation","Passband","Digital integrated circuits","Frequency","Production","Automatic testing","Delay","Integrated circuit testing"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 1995. Proceedings., 1995 20th International Conference on
  • Print_ISBN
    0-7803-2786-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.1995.500962
  • Filename
    500962