Title :
Comparison of different test strategies on a mixed-signal circuit
Author :
Juraj Brenkus;Viera Stopjakova;Ronny Vanhooren;Anton Chichkov
Author_Institution :
Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia
Abstract :
An experiment comparing the efficiency of different test strategies on a moderate complexity mixed-signal circuit with 1300 nodes is presented. Selected test strategies from the groups of functional, structural and parametric approaches were considered. Bridging faults are taken into account and fault simulations results are shown, where fault coverage, efficiency and quality of the tests are evaluated.
Keywords :
"Circuit testing","Costs","Production","Circuit faults","Semiconductor device testing","Manufacturing processes","Radio frequency","Silicon","Environmental economics","Analog integrated circuits"
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS ´09. 12th International Symposium on
Print_ISBN :
978-1-4244-3341-4
DOI :
10.1109/DDECS.2009.5012090
