DocumentCode
3631762
Title
Sensitivity of output response to geometrical dimensions in VLSI interconnects
Author
Agnieszka Ligocka-Wardzinska;Wojciech Bandurski
Author_Institution
Poznan University of Technology, Poland
fYear
2009
Firstpage
1
Lastpage
4
Abstract
The paper presents a sensitivity analysis of step and ramp response of VLSI interconnects to geometrical dimensions of microstrip model of higher level interconnects. The method is based on analytical form of VLSI output response calculated using multiple scales method.
Keywords
"Very large scale integration","Integrated circuit interconnections","Solid modeling","Inductance","Microstrip","Impedance","Power transmission lines","Differential equations","Power system interconnection","Paper technology"
Publisher
ieee
Conference_Titel
Signal Propagation on Interconnects, 2009. SPI ´09. IEEE Workshop on
Print_ISBN
978-1-4244-4490-8
Type
conf
DOI
10.1109/SPI.2009.5089863
Filename
5089863
Link To Document