DocumentCode :
3631807
Title :
Test Technology Technical Council (TTTC)
fYear :
2009
Keywords :
"Technical Councils","USA Councils","Logic testing","System testing","Technical activities","Electronic equipment testing","Meetings","Conferences","Logic design","Art"
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS ´09. 27th IEEE
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.68
Filename :
5116598
Link To Document :
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