DocumentCode

3631809

Title

Awards

fYear

2009

Keywords

Awards

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2009. VTS ´09. 27th IEEE

ISSN

1093-0167

Print_ISBN

978-0-7695-3598-2

Type

conf

DOI

10.1109/VTS.2009.70

Filename

5116600