Title :
Performance of rotated PSK over Nakagami-m fading channels
Author :
Ahmet Yilmaz;Oguz Kucur
Author_Institution :
Elektronik M?hendisli?i B?l?m?Gebze Y?ksek Teknoloji Enstit?s?, Turkey
fDate :
4/1/2009 12:00:00 AM
Abstract :
In this paper, the improvements in symbol error probability (SEP) / bit error probability (BEP) performances of rotated Phase Shift Keying (PSK) modulation are studied over Nakagami-m fading channels. Optimum rotation angles are obtained by the simulations, for different m values over frequency nonselective Nakagami-m slowly fading channels.
Keywords :
"Phase shift keying","Fading","Error probability","Phase modulation","Frequency","Tellurium","Gaussian processes","Interleaved codes"
Conference_Titel :
Signal Processing and Communications Applications Conference, 2009. SIU 2009. IEEE 17th
Print_ISBN :
978-1-4244-4435-9
DOI :
10.1109/SIU.2009.5136536
