DocumentCode
3632470
Title
Something I Always Wanted to Know About Test, But Was Afraid to Ask
Author
Christian Landrault
fYear
2009
Keywords
"Circuit faults","Retirement","Automatic testing","Automatic control","Computer science","Fault tolerance","Computer architecture","Digital systems","Robots","Microelectronics"
Publisher
ieee
Conference_Titel
Test Symposium, 2009 14th IEEE European
ISSN
1530-1877
Print_ISBN
978-0-7695-3703-0
Type
conf
DOI
10.1109/ETS.2009.28
Filename
5170451
Link To Document