3632503

2009 IRPS reliability year in review seminar

2009

1

1

"Seminars","High-K gate dielectrics","High K dielectric materials","Measurement techniques","Testing","Threshold voltage","Dielectric substrates","III-V semiconductor materials","Reliability engineering","Marketing and sales"

ieee

Reliability Physics Symposium, 2009 IEEE International

1541-7026

978-1-4244-2888-5

1938-1891

conf

10.1109/IRPS.2009.5173212

5173212