• DocumentCode
    3632503
  • Title

    2009 IRPS reliability year in review seminar

  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    1
  • Keywords
    "Seminars","High-K gate dielectrics","High K dielectric materials","Measurement techniques","Testing","Threshold voltage","Dielectric substrates","III-V semiconductor materials","Reliability engineering","Marketing and sales"
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2009 IEEE International
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-2888-5
  • Electronic_ISBN
    1938-1891
  • Type

    conf

  • DOI
    10.1109/IRPS.2009.5173212
  • Filename
    5173212
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3632503