DocumentCode :
3632565
Title :
Comparative analysis of various methods to reach the 1.3-µm emission in GaInNAs/GaAs QW VCSELs
Author :
Konrad Marszalek;Robert P. Sarzala;Wlodzimierz Nakwaski
Author_Institution :
Laboratory of Computer Physics, Institute of Physics, Technical University of Lodz, Wolczanska 219, 90-924, Poland
fYear :
2009
Firstpage :
1
Lastpage :
4
Abstract :
Three methods to obtain in GaAs-based oxide-confined GaInNAs/GaAs quantum-well (QW) VCSELs an efficient emission of the 1.3-µm radiation have been analysed and compared with the aid of the comprehensive fully self-consistent model. In the tuned VCSEL, QW composition (high N content) and thickness are selected to tune the 1.3-µm emission which ensures low threshold currents. However, manufacturing of such N-rich GaInNAs layers and/or such thin QWs threatens with generation of structure defects or even cracking. The 1.3-µm emission may be also forced in VCSELs with lower nitride QW content by the cavity appropriately detuned with respect to the active-region gain spectrum. Such a detuned VCSEL exhibits excellent properties at elevated ambient temperatures whereas its operation at room temperature may be reached at the price of a very high lasing threshold only. Introducing inter-mediate layers of lower energy gaps on both QW sides also enables reaching the tuned 1.3-µm lasing emission in VCSELs with lower QW nitride content. However, this QW-modified VCSEL is more sensitive to temperature increases and its lasing operation is stopped at higher temperatures. Therefore it may be concluded, that a choice of the most appropriate active region structure depends on a particular VCSEL application.
Keywords :
"Gallium arsenide","Vertical cavity surface emitting lasers","Temperature sensors","Performance gain","Physics","Quantum wells","Threshold current","Manufacturing","Distributed Bragg reflectors","Apertures"
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks, 2009. ICTON ´09. 11th International Conference on
ISSN :
2162-7339
Print_ISBN :
978-1-4244-4825-8
Type :
conf
DOI :
10.1109/ICTON.2009.5185165
Filename :
5185165
Link To Document :
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