Title :
Fault-Based Test Case Generation for Component Connectors
Author :
Bernhard K. Aichernig;Farhad Arbab;Lacramioara Astefanoaei;Frank S. de Boer;Meng Sun;Jan Rutten
Author_Institution :
IIST, UNU, Macao, China
Abstract :
The complex interactions appearing in service-oriented computing make coordination a key concern in service-oriented systems. In this paper, we present a fault-based method to generate test cases for component connectors from specifications. For connectors, faults are caused by possible errors during the development process, such as wrongly used channels, missing or redundant subcircuits, or circuits with wrongly constructed topology. We give test cases and connectors a unifying formal semantics by using the notion of design, and generate test cases by solving constraints obtained from the specification and faulty connectors. A prototype symbolic test case generator serves to demonstrate the automatizing of the approach.
Keywords :
"Connectors","System testing","Circuit faults","Circuit testing","Software testing","Prototypes","Large-scale systems","Software systems","Software engineering","Sun"
Conference_Titel :
Theoretical Aspects of Software Engineering, 2009. TASE 2009. Third IEEE International Symposium on
Print_ISBN :
978-0-7695-3757-3
DOI :
10.1109/TASE.2009.14