Title :
DC Transient Monitoring and analysis to prevent EOS in burn-in systems
Author :
Yong Jaimsomporn;Surapol Phunyapinuant;Wayne Tan
Author_Institution :
Advanced Micro Devices, Bangkok Thailand
Abstract :
This paper describes a Direct Current (DC) Transient Monitoring system integrated in burn-in test systems, to detect exceed voltages and occurrences per period limits, and record readings into a database for analysis of noise (physical and behavior). The system has features to automatically shut down a burn-in system to prevent damage to devices under test from electrical overstress (EOS) events.
Keywords :
"Transient analysis","Monitoring","Earth Observing System","Connectors","System testing","Power supplies","Instruments","Data analysis","Life testing","Grounding"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD ´01.
