مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3633141

Title :

Layout for ESD and latchup robustness

Author :

Alan Righter

Author_Institution :

Analog Devices, USA

fYear :

2006

Firstpage :

371

Lastpage :

371

Keywords :

"Electrostatic discharge","Robustness","Guidelines","Earth Observing System","Integrated circuit layout","Manufacturing","Failure analysis","Routing","Instruments"

Publisher :

ieee

Conference_Titel :

Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.

Electronic_ISBN :

2164-9340

Type :

conf

Filename :

5256751

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3633141