Advanced topics in ESD auditing

Summary form only given, as follows. A record of the workshop was not made available for publication as part of the conference proceedings. This workshop will focus discussion on some of the more specialized electrostatic auditing techniques and analytical methods used to augment standard approaches. Some of the elements presented for discussion include measuring specific product/device ESD vulnerabilities in different manufacturing environments and processes, data collection requirements, some uses for statistical methods in evaluating ESD risk, and the role of specialized ESD audits in process modeling. Discussion topics will include the role of ESD/EMI event detection during product/device handling and interference testing, direct charge and voltage measurements of products at discrete process points, and some common measurement pitfalls. Case studies will be provided to stimulate discussion and topic sharing. The goal of this workshop is to provide ESD auditors, program managers, consultants and interested others an opportunity to share technical approaches for evaluating electrostatic risk across the semiconductor, flat panel, disk-drive, electronics and other industries. You are invited to send your comments to the workshop moderator at info@esda.org, with the topic "2006 ESD Symposium Workshop" in the subject line.