• DocumentCode
    3633144
  • Title

    System level stress and the impact on device ESD protection

  • Author

    Wolfgang Stadler

  • Author_Institution
    Infineon, USA
  • fYear
    2006
  • Firstpage
    370
  • Lastpage
    370
  • Keywords
    "Stress","Electrostatic discharge","Earth Observing System","Surge protection","Robustness","Integrated circuit technology","Integrated circuit measurements","System testing","Standardization","Discussion forums"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.
  • Electronic_ISBN
    2164-9340
  • Type

    conf

  • Filename
    5256754
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3633144