3633144

System level stress and the impact on device ESD protection

Wolfgang Stadler

Infineon, USA

2006

370

370

"Stress","Electrostatic discharge","Earth Observing System","Surge protection","Robustness","Integrated circuit technology","Integrated circuit measurements","System testing","Standardization","Discussion forums"

ieee

Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.

2164-9340

conf

5256754