• DocumentCode
    3633148
  • Title

    ESD troubleshooting and testing practices

  • Author

    Hans Kunz

  • Author_Institution
    Texas Instruments, USA
  • fYear
    2006
  • Firstpage
    366
  • Lastpage
    366
  • Keywords
    "Electrostatic discharge","Testing","Instruments","Earth Observing System","Stress","Protection","Test equipment","Europe"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.
  • Electronic_ISBN
    2164-9340
  • Type

    conf

  • Filename
    5256758
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3633148