DocumentCode :
3633148
Title :
ESD troubleshooting and testing practices
Author :
Hans Kunz
Author_Institution :
Texas Instruments, USA
fYear :
2006
Firstpage :
366
Lastpage :
366
Keywords :
"Electrostatic discharge","Testing","Instruments","Earth Observing System","Stress","Protection","Test equipment","Europe"
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.
Electronic_ISBN :
2164-9340
Type :
conf
Filename :
5256758
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3633148