Title :
ESD control and design for extremely sensitive ("Class 0") devices
Author_Institution :
Seagate, USA
Abstract :
Summary form only given, as follows. Due to cost and other considerations, the ESDA believes that more and more devices, including common integrated circuits, will have "Class 0" (< 100V HBM) ESD damage thresholds. It is not just magnetic recording anymore, and the "old rules" of ESD control sometimes are not sufficient. This workshop will discuss methods which did, and methods which did not, work in ESD control for class 0 devices. A record of the panel discussion was not made available for publication as part of the conference proceedings.
Keywords :
"Electrostatic discharge","Instruments","Earth Observing System","Testing","Stress","Protection","Test equipment","Europe"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.
Electronic_ISBN :
2164-9340