Local light to electric energy conversion measurement of silicon solar cells

The paper is focused on non-destructive detection of structural errors, and on local illumination to electric energy conversion measurement in the solar cell using a near-field optical scanning microscope (SNOM). The principal objective of this study is to find out a relationship between surface or structure errors and defects observed in electric characteristics of solar cell samples. The defects and local mechanical damage of Si solar cell can result in lower light to electric energy conversion efficiency. The influence of surface scratching on reverse I-V characteristics of single-crystal silicon solar cell is also presented. The topography measurement, local surface reflection and local light to electric energy conversion measurement in areas damaged by a scratch are also provided.