Title :
The contact resistance at interface of two different thick film layers
Author :
Ivana Beshajova Pelikanova;Filip Slovak;Ales Duraj
Author_Institution :
Department of Electrotechnology, Faculty of Electrical Engineering, CTU in Prague, CZ
Abstract :
The work is focused on analysis of interface of two different thick film layers. Contact resistance between conductive a resistive layers was measured and analyzed. Contact resistance is influenced by technology of deposition of layers, by conditions of curing, by materials and surface quality of substrate etc. Three point methods is used for measuring of contact resistance. This parameter was analyzed in dependence on geometry of contact area. Polymer thick film pastes were used for preparation of samples.
Keywords :
"Contact resistance","Thick films","Electrical resistance measurement","Conductivity measurement","Curing","Conducting materials","Surface resistance","Substrates","Geometry","Polymer films"
Conference_Titel :
Electronics Technology, 2008. ISSE ´08. 31st International Spring Seminar on
Print_ISBN :
978-1-4244-3973-7;978-1-4244-3972-0
Electronic_ISBN :
2161-2064
DOI :
10.1109/ISSE.2008.5276617
