• DocumentCode
    3633514
  • Title

    Sensitivity of threshold crossing time to geometrical dimensions of VLSI interconnects

  • Author

    Agnieszka Ligocka-Wardzinska;Wojciech Bandurski

  • Author_Institution
    Multimedia Telecommunications and Microelectronics, Poznan University of Technology, Poland
  • fYear
    2009
  • Firstpage
    482
  • Lastpage
    485
  • Abstract
    The paper presents a sensitivity analysis of threshold crossing time for the step and ramp response of VLSI interconnects to geometrical dimensions of microstrip model of higher level interconnects. The method is based on threshold crossing time obtained for analytical form of VLSI output response calculated using multiple scales method.
  • Keywords
    "Very large scale integration","Integrated circuit interconnections","Integrated circuit modeling","Sensitivity analysis","Delay","Inductance","Transmission line theory","Voltage","Capacitance","Equations"
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits & Systems, 2009. MIXDES ´09. MIXDES-16th International Conference
  • Print_ISBN
    978-1-4244-4798-5
  • Type

    conf

  • Filename
    5289458