DocumentCode
3633514
Title
Sensitivity of threshold crossing time to geometrical dimensions of VLSI interconnects
Author
Agnieszka Ligocka-Wardzinska;Wojciech Bandurski
Author_Institution
Multimedia Telecommunications and Microelectronics, Poznan University of Technology, Poland
fYear
2009
Firstpage
482
Lastpage
485
Abstract
The paper presents a sensitivity analysis of threshold crossing time for the step and ramp response of VLSI interconnects to geometrical dimensions of microstrip model of higher level interconnects. The method is based on threshold crossing time obtained for analytical form of VLSI output response calculated using multiple scales method.
Keywords
"Very large scale integration","Integrated circuit interconnections","Integrated circuit modeling","Sensitivity analysis","Delay","Inductance","Transmission line theory","Voltage","Capacitance","Equations"
Publisher
ieee
Conference_Titel
Mixed Design of Integrated Circuits & Systems, 2009. MIXDES ´09. MIXDES-16th International Conference
Print_ISBN
978-1-4244-4798-5
Type
conf
Filename
5289458
Link To Document