DocumentCode :
3633880
Title :
An oscilloscope array for high-impedance device characterization
Author :
Fred Chen;Anantha Chandrakasan;Vladimir Stojanovic
Author_Institution :
Department of Electrical Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA
fYear :
2009
Firstpage :
112
Lastpage :
115
Abstract :
An equivalent time oscilloscope array is implemented in a 90nm CMOS technology. A combination of adjustable termination, calibration circuitry and capacitance compensation enables driver bandwidths between 0.4 to 2GHz for termination impedances of 20Ω to 2kΩ for extraction of S-parameters and delay characteristics of high impedance devices such as carbon nanotubes (CNTs) and graphene. Measurement results show that the capacitance compensation technique enhances the bandwidth by 3X for impedances between 2kΩ and 20kΩ.
Keywords :
"Oscilloscopes","Impedance","CMOS technology","Capacitance","Bandwidth","Calibration","Driver circuits","Scattering parameters","Delay","Carbon nanotubes"
Publisher :
ieee
Conference_Titel :
ESSCIRC, 2009. ESSCIRC ´09. Proceedings of
ISSN :
1930-8833
Print_ISBN :
978-1-4244-4355-0;978-1-4244-4354-3
Type :
conf
DOI :
10.1109/ESSCIRC.2009.5325935
Filename :
5325935
Link To Document :
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