• DocumentCode
    3633986
  • Title

    Charge injection induced sample and hold error analysis

  • Author

    Andrei Danchiv;Mircea Bodea;Ana-Maria Luca;Ioan-Alexandru Tranca

  • Author_Institution
    Infineon Technologies Romania, Blvd. Dimitrie Pompeiu nr. 6, Bucharest, Romania
  • Volume
    2
  • fYear
    2009
  • Firstpage
    491
  • Lastpage
    494
  • Abstract
    This paper analysis the charge injection induced error in CMOS switched capacitor circuits. For this purpose, the basic S/H topology is used and an on-off transition model is considered, for both n and p channel switches. The transient error voltage behavior is presented. The final error value dependence on circuit parameters is analyzed and compared with simulation results.
  • Keywords
    "Error analysis","Switches","Voltage","Capacitance","MOS capacitors","Character generation","Equations","Switched capacitor circuits","Circuit topology","Circuit analysis"
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2009. CAS 2009. International
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4244-4413-7
  • Electronic_ISBN
    2377-0678
  • Type

    conf

  • DOI
    10.1109/SMICND.2009.5336668
  • Filename
    5336668
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3633986