DocumentCode :
3634584
Title :
Pt-induced high density PtSi nanocrystals and their application in nonvolatile memory
Author :
Bei Li;Jingjian Ren;Jianlin Liu
Author_Institution :
Department of Electrical Engineering, University of California, Riverside, USA
fYear :
2009
Firstpage :
1
Lastpage :
2
Abstract :
Nonvolatile memories with semiconductor or metal nanocrystals as storage elements in metal-oxide-semiconductor field effect transistors (MOSFET) have been researched intensively by researchers in both industry and academic institutions. Compared with semiconductor nanocrystals, metal nanocrystal devices should have better performance due to the higher storage capacity as a result of higher density of states. However the drawback of the poor thermal stability makes the application of metal nanocrystal memory difficult. Metallic silicide nanocrystals are more thermally stable than metal nanocrystals. TiSi2 [1], CoSi2 [2–3], and NiSi [4] nanocrystals have been synthesized by other methods, which have a common process, i.e., high-temperature annealing. In this presentation, we report novel fabrication process of the formation of high density silicide nanocrystals and their prototype device.
Keywords :
"Nanocrystals","Nonvolatile memory","Silicides","FETs","MOSFET circuits","Metals industry","Thermal stability","Annealing","Fabrication","Prototypes"
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2009. ISDRS ´09. International
Print_ISBN :
978-1-4244-6030-4
Type :
conf
DOI :
10.1109/ISDRS.2009.5378312
Filename :
5378312
Link To Document :
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