Title :
Pd-C film for sensor applications
Author :
R. Belka;E. Czerwosz;J. Kęczkowska;E. Kowalska;M. Kozłowski;J. Rymarczyk;M. Suchańska
Author_Institution :
Kielce University of Technology, 25-413, Al.1000-lecia PP 7, Poland
Abstract :
Characterisation of C-Pd films composed of carbon and palladium nanograins and obtained in two-steps method is presented. Film obtained in first step exhibits multiphase structure composed of nanograins of fullerenes, amorphous carbon and palladium nanocrystals. This film is modified in CVD process. Final films has porous carbonaceous form. All films were studied by scanning electron microscopy (SEM), atomic force microscopy (AFM) and Raman spectroscopy. Structure, molecular structure and topography of obtained films is studied with these methods.
Keywords :
"Atomic force microscopy","Scanning electron microscopy","Palladium","Sensor phenomena and characterization","Nanostructures","Amorphous materials","Nanocrystals","Raman scattering","Spectroscopy","Surfaces"
Conference_Titel :
ICTON Mediterranean Winter Conference,2009. ICTON-MW 2009. 3rd
Print_ISBN :
978-1-4244-5745-8
DOI :
10.1109/ICTONMW.2009.5385541
