Title :
CPU Testability in Embedded Systems
Author :
Janusz Sosnowski;Lukasz Tupaj
Author_Institution :
Inst. of Comput. Sci., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
The paper deals with the problem of testing CPUs in embedded systems taking into account application properties. Basing on the developed original software tools we have analysed the coverage of CPU functionality and operational stresses for many benchmark programs. The experimental results confirmed the need of introducing application driven testing of CPUs to assure high fault coverage with acceptable software and time overheads. This original approach has been used in some real systems.
Keywords :
"System testing","Embedded system","Circuit testing","Software testing","Application software","Built-in self-test","Microprocessors","Central Processing Unit","Design for testability","Hardware"
Conference_Titel :
Electronic Design, Test and Application, 2010. DELTA ´10. Fifth IEEE International Symposium on
Print_ISBN :
978-1-4244-6025-0;978-0-7695-3978-2
DOI :
10.1109/DELTA.2010.33
