DocumentCode

3635223

Title

Awards

fYear

2010

Keywords

Awards

Publisher

ieee

Conference_Titel

Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE

ISSN

1065-2221

Print_ISBN

978-1-4244-9458-3

Type

conf

DOI

10.1109/STHERM.2010.5444326

Filename

5444326