• DocumentCode
    3635406
  • Title

    Pseudorandom versus deterministic testing of Intel 80/spl times/86 processors

  • Author

    J. Sosnowski;A. Kusmierczyk

  • Author_Institution
    Inst. of Comput. Sci., Warsaw Univ. of Technol., Poland
  • fYear
    1996
  • Firstpage
    329
  • Lastpage
    336
  • Abstract
    The paper deals with the problem of testing microprocessors in the system environment. We discuss two approaches to testing microprocessors: deterministic and pseudorandom. They are related to Intel 80/spl times/86 processors. Many drawbacks of the deterministic approach can be overcome with pseudorandom tests. However developing pseudorandom test programs we face some other problems. The paper shows how to combine the two approaches.
  • Keywords
    "Circuit testing","Circuit faults","Microprocessors","Logic testing","Adders","System testing","Built-in self-test","Data processing","Computer science","Registers"
  • Publisher
    ieee
  • Conference_Titel
    EUROMICRO 96. Beyond 2000: Hardware and Software Design Strategies., Proceedings of the 22nd EUROMICRO Conference
  • ISSN
    1089-6503
  • Print_ISBN
    0-8186-7487-3
  • Type

    conf

  • DOI
    10.1109/EURMIC.1996.546398
  • Filename
    546398
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3635406