DocumentCode

3635467

Title

Awards

fYear

2010

Keywords

Awards

Publisher

ieee

Conference_Titel

VLSI Test Symposium (VTS), 2010 28th

ISSN

1093-0167

Print_ISBN

978-1-4244-6649-8

Electronic_ISBN

2375-1053

Type

conf

DOI

10.1109/VTS.2010.5469630

Filename

5469630