Space charge spectroscopic studies of indium doped Cd0.91Mn0.09Te

The thermally stimulated current discharge method (TSDC) and deep level transient spectroscopy (DLTS) have been used to study defects in indium doped Cd_0.91Mn_0.09Te. The measurements were performed within a temperature range of 80K-300K. The TSDC measurements reveal the presence of six traps. For the dominant traps, activation energies of 0.11 eV, 0.25 eV, 0.27 eV and 0.4eV were obtained. DLTS studies yield the presence of five majority electron traps. The activation energy was determined unambiguously for three out of the observed traps as 0.25eV, 0.27eV and 0.39eV. The agreement among the activation energies obtained by both methods is satisfactory implying the complementary character of both techniques.