• DocumentCode
    3636126
  • Title

    Automated SEU fault emulation using partial FPGA reconfiguration

  • Author

    Uro? Legat;Anton Biasizzo;Franc Novak

  • Author_Institution
    Computer Systems Department, Jozef Stefan Institute, Ljubljana, Slovenia
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    24
  • Lastpage
    27
  • Abstract
    FPGAs are subjected to SEU faults. Fault emulation methods are used to verify the behavior of the system in the presence of fault. In this paper an automated fault emulation approach is presented. An original, fully automated extraction of SEU fault sources is introduced and the injection procedure for various types of faults in FPGA configuration and user memory is explained. Faults are injected during run-time using an embedded microprocessor. Only the resources affected by the faults are reconfigured. A prototype fault injection tool was developed and the approach is demonstrated on two different FPGA applications, micro processor BIST, and AES BIST.
  • Keywords
    "Emulation","Field programmable gate arrays","Circuit faults","Single event upset","Table lookup","Runtime","Flip-flops","Testing","Random access memory","Built-in self-test"
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
  • Print_ISBN
    978-1-4244-6612-2
  • Type

    conf

  • DOI
    10.1109/DDECS.2010.5491825
  • Filename
    5491825