DocumentCode

3636240

Title

Copyrigt page

fYear

2010

Firstpage

1

Lastpage

1

Publisher

ieee

Conference_Titel

VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on

Print_ISBN

978-1-4244-5269-9

Type

conf

DOI

10.1109/VDAT.2010.5496645

Filename

5496645