Title :
Step response sensitivity to RLC parameters of VLSI interconnect
Author :
Agnieszka Wardzińska;Wojciech Bandurski
Author_Institution :
Multimedia Telecommunications and Microelectronics, Poznań
Abstract :
In the paper there is considered sensitivity of the voltage step response of the system inverter-interconnect-inverter with respect to RLC parameters. The sensitivity formulas for RLC parameters are given. There is also analyzed voltage step response deviation to relative parameter RLC variations.
Keywords :
"Integrated circuit interconnections","Resistance","Inverters","Inductance","Capacitance","Sensitivity analysis"
Conference_Titel :
Signals and Electronic Systems (ICSES), 2010 International Conference on
Print_ISBN :
978-1-4244-5307-8
