Title :
High resolution measurements to determine the permittivity in artificial structures
Author :
C. Krebs;J. Rubart;A. Hommes;Ralf Brauns;Dirk Nüßler
Author_Institution :
RheinAhrCampus Remagen, Department of Mathematics and Technology, Germany
Abstract :
The characterization of materials is one major task for systems which work e.g. in the field of quality or production control. One factor to analyze material volume information is the permittivity. The following paper describes a measurement method to determine and gives an overview about the measurement system. In addition first measurement results will be shown.
Keywords :
"Frequency measurement","Permittivity measurement","Materials","Permittivity","Dielectrics","Optical sensors"
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Print_ISBN :
978-1-4244-6655-9
Electronic_ISBN :
2162-2035
DOI :
10.1109/ICIMW.2010.5613004
