DocumentCode :
3638912
Title :
Application of multi-criteria optimization algorithms to numerical material extraction of thin layers through nanoindentaion technique
Author :
Łukasz Dowhań;Artur Wymysłowski;Paweł Janus;Magdalena Ekwińska;Olaf Wittler
Author_Institution :
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Poland
fYear :
2010
Firstpage :
1
Lastpage :
7
Abstract :
Current developments and trends in microelectronics are focused on thin layers and novel materials. This leads to application of different test and measurement methods, which are capable to measure basic mechanical properties of such materials on micro-scale and nano-scale. The presented paper focuses on application of the nanoindentation technique in order to extract the basic elastic and elasto-plastic mechanical properties through numerical approaches. In order to extract the elasto-plastic material data of the investigated thin layers the numerical process was designed. First of all, the nanoindentation process was elaborated in FEM Abaqus software. Then, the results were compared to the measurements and processed by the numerical optimization algorithms.
Keywords :
"Strain","Strain measurement"
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Print_ISBN :
978-1-4244-8553-6
Type :
conf
DOI :
10.1109/ESTC.2010.5642971
Filename :
5642971
Link To Document :
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