• DocumentCode
    3639071
  • Title

    Differences in the gas sensing properties readout with n and p-type MOX materials

  • Author

    C. E. Simion;A. Tomescu-Stanoiu

  • Author_Institution
    National Institute of Materials Physics, P.O. Box MG-7, 077125 Bucharest-Magurele, Romania
  • Volume
    1
  • fYear
    2010
  • Firstpage
    201
  • Lastpage
    204
  • Abstract
    The way in which surface changes are transduced into a variation of an electrical parameter (often electrical resistance) depends on the surface oxidation level, material morphology its semiconductor behaviour, etc. Therefore, if one wants to understand more about the way in which gas-surface interactions affect the gas sensing properties of material, complex phenomenological and spectroscopic investigations are needed. Herein, by simultaneous DC and relative work function investigations we could explain the differences induced by the MOX semiconductor character (n and p-type) to the surface phenomena transduction mechanism.
  • Keywords
    "Materials","Surface resistance","Sensors","Surface morphology","Surface treatment","Semiconductor device measurement"
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference (CAS), 2010 International
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4244-5783-0
  • Type

    conf

  • DOI
    10.1109/SMICND.2010.5649077
  • Filename
    5649077