مرکز منطقه ای اطلاع رساني علوم و فناوري - Delay Test Techniques For Boundary Scan Based Archictures

DocumentCode :

3640548

Title :

Delay Test Techniques For Boundary Scan Based Archictures

Author :

Hoon Chang Hoon Chang;J.A. Abraham

fYear :

1992

fDate :

6/14/1905 12:00:00 AM

Publisher :

ieee

Conference_Titel :

Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992

Print_ISBN :

0-7803-0246-X

Type :

conf

DOI :

10.1109/CICC.1992.591296

Filename :

5727344

Link To Document :