DocumentCode :
3640553
Title :
A Cost-effective Test Data Compaction Scheme
Author :
E. Wu;M.R. Moskowitz
fYear :
1992
fDate :
6/14/1905 12:00:00 AM
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Print_ISBN :
0-7803-0246-X
Type :
conf
DOI :
10.1109/CICC.1992.591301
Filename :
5727349
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3640553
