DocumentCode
3640578
Title
Layout Analysis And Automatic Test Point Selection For Fast Prototype Debug Using E-beam Or Laser-beam Testsystems
Author
R. Scharf;C. Kuntzsch;K. Helmreich;W. Wolz;K.D. MuIler-GIaser
fYear
1992
fDate
6/14/1905 12:00:00 AM
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Print_ISBN
0-7803-0246-X
Type
conf
DOI
10.1109/CICC.1992.591326
Filename
5727374
Link To Document