DocumentCode :
3640618
Title :
A Scan-testable Mask Programmable Gate Array For Conversion Of FPGA Designs
Author :
S.O. Frake;S.G. Lawson;J.E. Mahoney
fYear :
1992
fDate :
6/14/1905 12:00:00 AM
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Print_ISBN :
0-7803-0246-X
Type :
conf
DOI :
10.1109/CICC.1992.591856
Filename :
5727415
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3640618
