DocumentCode
3641165
Title
Mutation Testing of "Go-Back" Functions Based on Pushdown Automata
Author
Fevzi Belli;Mutlu Beyazit;Tomohiko Takagi;Zengo Furukawa
Author_Institution
Fac. of Comput. Sci., Electr. Eng. &
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
249
Lastpage
258
Abstract
A go-back (GB) function for canceling recent user or system operations and going back to and resuming of previous state(s) is very often used regardless of the application domain. Therefore, faulty handling of them can cause severe damages in those applications. This paper proposes a mutation-based approach to testing GB functions modeled by pushdown automata. Novel mutation operators, recent coverage criteria, and a new algorithm for test case generation are introduced. A case study validates the approach and discusses its characteristics.
Keywords
"Testing","Unified modeling language","Personal digital assistants","Automata","Software","Context modeling","Systematics"
Publisher
ieee
Conference_Titel
Software Testing, Verification and Validation (ICST), 2011 IEEE Fourth International Conference on
ISSN
2159-4848
Print_ISBN
978-1-61284-174-8
Type
conf
DOI
10.1109/ICST.2011.30
Filename
5770614
Link To Document