DocumentCode :
3642412
Title :
Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS
Author :
Massoud Mokhtarpour Ghahroodi;Mark Zwolinski;Rick Wong;Shi-Jie Wen
Author_Institution :
Sch. of Electron. &
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
202
Lastpage :
202
Abstract :
Soft errors are a significant reliability issue for Ultra Deep-Sub-Micron (UDSM) CMOS circuits. Therefore, an accurate assessment of the Soft Error Rate (SER) is crucial. In this paper, we argue that the conventional definitions for the Window of Vulnerability (WOV) under-estimate the risk. We propose a new method for determining the timing factors and WOV for the sequential elements from the susceptibility perspective rather than the conventional performance perspective. We also discuss that the process variation does not have any special impact on the WOV. Our methodology leads to a more realistic definition of the WOV for SER computation.
Keywords :
"Clocks","Delay","CMOS integrated circuits","Logic gates","Electronic mail","Libraries"
Publisher :
ieee
Conference_Titel :
European Test Symposium (ETS), 2011 16th IEEE
ISSN :
1530-1877
Print_ISBN :
978-1-4577-0483-3
Type :
conf
DOI :
10.1109/ETS.2011.40
Filename :
5957948
Link To Document :
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