• DocumentCode
    3642704
  • Title

    A new field-probing technique for millimeter-wave components

  • Author

    A. Basu;T. Itoh

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    3
  • fYear
    1997
  • fDate
    6/19/1905 12:00:00 AM
  • Firstpage
    1667
  • Abstract
    A new technique for probing the fields in the vicinity of a millimeter-wave circuit or antenna, using a dielectric waveguide is described. This technique is expected to be particularly useful for frequencies greater than 100 GHz, where effects of manufacturing inaccuracies, and minute material defects may lead to hard-to-trace faults.
  • Keywords
    "Millimeter wave technology","Probes","Millimeter wave circuits","Frequency","Dielectric materials","Millimeter wave measurements","Rectangular waveguides","Circuit testing","Dielectric measurements","Dielectric substrates"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1997., IEEE MTT-S International
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3814-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1997.596725
  • Filename
    596725
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3642704