• DocumentCode
    3643080
  • Title

    Analysis of accelerated degradation test under constant stress with errors for longitudinal data

  • Author

    Sai-Yin Zhang;Zhong-Zhan Zhang

  • Author_Institution
    College of Applied Sciences, Beijing University of Technology, China 100124
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    320
  • Lastpage
    324
  • Abstract
    In industrial statistics, the degradation test is regularly used in the analysis of product reliability. This paper is focused on the modeling of accelerated degradation test with longitudinal observation under constant stresses with Berkson-type measurement errors, and suggests the minimum distance estimator for the parameters in the model. The consistency and asymptotic normality of the estimator are obtained, and the performance of the estimator for moderate sample sizes is shown by simulation.
  • Keywords
    "Stress","Data models","Reliability","Computational modeling","Silicon","Analytical models","Silicon carbide"
  • Publisher
    ieee
  • Conference_Titel
    Intelligence and Security Informatics (ISI), 2011 IEEE International Conference on
  • Print_ISBN
    978-1-4577-0082-8
  • Type

    conf

  • DOI
    10.1109/ISI.2011.5984106
  • Filename
    5984106