DocumentCode
3643080
Title
Analysis of accelerated degradation test under constant stress with errors for longitudinal data
Author
Sai-Yin Zhang;Zhong-Zhan Zhang
Author_Institution
College of Applied Sciences, Beijing University of Technology, China 100124
fYear
2011
fDate
7/1/2011 12:00:00 AM
Firstpage
320
Lastpage
324
Abstract
In industrial statistics, the degradation test is regularly used in the analysis of product reliability. This paper is focused on the modeling of accelerated degradation test with longitudinal observation under constant stresses with Berkson-type measurement errors, and suggests the minimum distance estimator for the parameters in the model. The consistency and asymptotic normality of the estimator are obtained, and the performance of the estimator for moderate sample sizes is shown by simulation.
Keywords
"Stress","Data models","Reliability","Computational modeling","Silicon","Analytical models","Silicon carbide"
Publisher
ieee
Conference_Titel
Intelligence and Security Informatics (ISI), 2011 IEEE International Conference on
Print_ISBN
978-1-4577-0082-8
Type
conf
DOI
10.1109/ISI.2011.5984106
Filename
5984106
Link To Document